Contents:
1.Introduction of materials characterization methods
2.Light microscopy with history
3.X-ray diffraction (XRD)
4.Transmission Electron Microscopy (TEM)
5.Scanning Electron Microscopy (SEM)
6.Scanning Tunneling Microscopy (STM)
7.Atomic Force Microscopy (AFM)
8.Ultraviolet Photoelectron Spectroscopy (UPS)
9.X-ray Photoelectron Spectroscopy (XPS)
10.Auger Electron Spectroscopy (AES)
11.Secondary Ion Mass Spectrometry for Surface Analysis (SIMS)
12.Fourier Transform Infrared Spectroscopy (FTIR)
13.Raman Microscopy
14.Thermal Analysis
- Teacher: huipan, Pan Hui